CUSTOMIZED
Substrate Material: UVFS (C7980)
Diameter: 12.7 mm +0/-0.1 mm
Thickness: 2.0 mm +/-0.1 mm
Clear aperture: >90%
Surface quality, S1/S2: 10-5 S-D per CA 10 mm according to MIL-PRF-13830B
Surface flatness, S1/S2: <λ@633 nm per Dia10 mm
Parallelism: <5 arcmin
Protective chamfer: 0.2-0.3 x 45°
Coatings (IBS):
S1 (arrow marks): HRsp_avg>98% @ 1580-2400 nm + HTp_avg>94% @ 640-765 nm, AOI=17°
S2: ARp<0.2@640-765 nm, AOI=17°
