CUSTOMIZED
Substrate Material: UVFS
Diameter: 12.7 mm +0/-0.1 mm
Edge Thickness: 6.35 mm +/-0.1 mm
Clear aperture: >10 mm
Surface quality, S1: 20-10 S-D per CA (as per MIL-PRF13830B)
Surface quality, S2: NA, polished
Surface flatness, S1: <λ/8 @633 nm over 5 mm round CA
Parallelism: < 1 arcmin
Protective chamfer: 0.2-0.4 mm x 45°
Chips: <0.2 mm stoned
Coatings (IBS):
S1 (arrow marks): HRs_avg> 99% AOI 45 deg, HRs_avg> 98% AOI 10 deg @ 630-1030 nm,
S2: uncoated
