CUSTOMIZED
Substrate Material: UVFS
Diameter: 25.4 mm +0/-0.1 mm
Edge Thickness: 3.0 mm +/-0.1 mm
Clear aperture: min 20 mm
Surface quality, S1/S2: 20-10 S-D over CA (as per MIL-PRF-13830B)
Surface flatness, S1: λ/8 @633 nm over 10 mm CA
Parallelism: < 30 arcsec
Protective chamfer: 0.2-0.4 mm x 45°
Chips: <0.2 mm stoned
Coatings (IBS):
S1 (arrow marks): PRs=96.8% +/-0.2% @ 1150 nm, AOI 45 deg.
S2: ARs<0.1% @ 1150 nm, 45 deg.
Absorption within coating: ~<10 ppm @ 1064 nm
