CUSTOMIZED
Substrate Material: UVFS
Diameter: 50.8 mm +0/-0.1 mm
Thickness: 9.52 mm +/-0.1 mm
Clear aperture: min. 40 mm
Surface quality, S1: 20-10 SD (as per MIL PRF-13830B)
Surface flatness, S1: λ/6 @ 633 nm over any 25 mm aperture within CA
Surface S2: inspection polished (80-50 SD)
Parallelism: <5 arcmin
Protective chamfer: 0.2-0.3 mm x 45 deg
Arrow marks to S1
Coatings (IBS):
S1 (arrow marks): HRs>99.9% @ 1064 nm, AOI 45 deg
S2: uncoated
