CUSTOMIZED
Substrate material: UVFS
Diameter: 25.4 mm +0/-0.1 mm
Edge thickness: 2.0 mm +/-0.1 mm
Center thickness: 10.4 mm
Clear aperture: min. 20 mm
Surface quality, S1/S2: 20-10 S-D over CA as per MIL-PRF-13830B
Surface irregularity, S1/S2: <λ/4 @633 nm per CA
Focal length: F=+30 mm +/-2% @ 546 nm
Radius of curvature: ROC= 13.802mm
Centration error: <3 arcmin
Protective chamfers: 0.1-0.3 mm x 45°
Arrow indicates S1 (CX)
Chips: <0.2 mm stoned
Coatings (IBS):
S1 (CX, arrow marks): AR<0.1% @ 950-1050 nm, AOI 0 deg.
S2 (PL): AR<0.1% @ 950-1050 nm, AOI 0 deg.
