CUSTOMIZED
Substrate material: Optical Grade Sapphire, C-Plane
Diameter: 38.1 mm +0/-0.1 mm
Edge thickness: 6.35 mm +/-0.1 mm
Clear aperture: min 31 mm
Surface quality, S1/S2: 40-20 S-D per CA (following MIL-PRF-13830B standard)
TWE: ≤ ¼ wave pwr. & irreg. over CA
Parallelism: < 3 arcmin
Protective chamfer: <0.4 mm x 45°
Chips: <0.2 mm stoned
Coatings (IBS):
S1 (arrow marks): HRa>99% @ 1535 nm + HTa>90% (best effort >95%) @ 2940 nm, AOI 45 deg.
S2: Uncoated
