CUSTOMIZED
Substrate material: UVFS (C7980 0F)
Diameter: 25.4 mm +0/-0.1 mm
Thickness: 3.0 mm +/-0.1 mm
Clear aperture: min 21mm
Surface quality, S1/S2: 20-10 S-D per CA
Surface flatness, S1/S2: <λ/8 @ 633 nm over 11 mm dia. CA
Parallelism: <3 arcmin
Protective chamfers: 0.2-0.4 mm x 45 deg
Chips: <0.2 mm stoned
Coatings (IBS):
S1 (arrow marks): HTp > 99.6% @ 1064nm + HRs > 99.9% @ 532 nm, AOI 0 deg.
S2: ARp < 0.1% @ 1064 nm, AOI 0 deg
